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Automatic Classifying Self-Admitted Technical Debt Using N-Gram IDF
http://hdl.handle.net/10061/13964
http://hdl.handle.net/10061/13964392e6af5-86d1-4221-b6bc-07a88c64060e
名前 / ファイル | ライセンス | アクション |
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fulltext (446.7 kB)
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2021-12-06 | |||||
タイトル | ||||||
タイトル | Automatic Classifying Self-Admitted Technical Debt Using N-Gram IDF | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Self Admitted Technical Debt | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | N-Gram IDF | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Multi class Classification | |||||
資源タイプ | ||||||
資源タイプ | conference paper | |||||
アクセス権 | ||||||
アクセス権 | open access | |||||
著者 |
Supatsara, Wattanakriengkrai
× Supatsara, Wattanakriengkrai× Napat, Srisermphoak× Sahawat, Sintoplertchaikul× Morakot, l Choetkiertiku× Chaiyong, Ragkhitwetsagul× Thanwadee, Sunetnanta× 畑, 秀明× 松本, 健一 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Technical Debt (TD) introduces a quality problem and increases maintenance cost since it may require improvements in the future. Several studies show that it is possible to automatically detect TD from source code comments that developers intentionally created, so-called self-admitted technical debt (SATD). Those studies proposed to use binary classification technique to predict whether a comment shows SATD. However, SATD has different types (e.g. design SATD and requirement SATD). In this paper, we therefore propose an approach using N-gram Inverse Document Frequency (IDF) and employ a multi-class classification technique to build a model that can identify different types of SATD. From the empirical evaluation on 10 open-source projects, our approach outperforms alternative methods (e.g. using BOW and TF-IDF). Our approach also improves the prediction performance over the baseline benchmark by 33% | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | This work has been supported by JSPS KAKENHI (Grant Number 16H05857 and 17H00731). | |||||
書誌情報 |
p. 316-322, 発行日 2019-12-05 |
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会議情報 | ||||||
会議名 | 2019 26th Asia-Pacific Software Engineering Conference (APSEC) | |||||
開催地 | Putrajaya | |||||
開催国 | MYS | |||||
出版者 | ||||||
出版者 | IEEE | |||||
EISSN/PISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 2640-0715 | |||||
出版者版DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1109/APSEC48747.2019.00050 | |||||
権利 | ||||||
権利情報 | c2019 IEEE | |||||
権利 | ||||||
権利情報 | 出版社許諾条件により、本文は2021年12月6日以降に公開 | |||||
著者版フラグ | ||||||
出版タイプ | AM |