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Defect and Elemental Analysis of Oxide TFT toward an All-solution processed Device
https://doi.org/10.34413/dr.01555
https://doi.org/10.34413/dr.01555de9acf4a-d90e-4c4b-9d2d-4fe3bf5b970d
名前 / ファイル | ライセンス | アクション |
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Item type | 学位論文(博士論文) / Thesis or Dissertation(1) | |||||
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公開日 | 2018-04-18 | |||||
タイトル | ||||||
タイトル | Defect and Elemental Analysis of Oxide TFT toward an All-solution processed Device | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | oxide TFT | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | siloxane | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | a-IGZO | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | all-solution process | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | gate insulator | |||||
資源タイプ | ||||||
資源タイプ | doctoral thesis | |||||
ID登録 | ||||||
ID登録 | 10.34413/dr.01555 | |||||
ID登録タイプ | JaLC | |||||
アクセス権 | ||||||
アクセス権 | open access | |||||
その他のタイトル | ||||||
その他のタイトル | 全溶液処理プロセスを目指した酸化物薄膜トランジスタの欠陥と元素分析 | |||||
その他のタイトル | ||||||
その他のタイトル | ゼン ヨウエキ ショリ プロセス オ メザシタ サンカブツ ハクマク トランジスタ ノ ケッカン ト ゲンソ ブンセキ | |||||
著者 |
Kulchaisit, Chaiyanan
× Kulchaisit, Chaiyanan |
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書誌情報 |
発行日 2018-03-23 |
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出版者 | ||||||
出版者 | Nara Institute of Science and Technology | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
学位名 | ||||||
学位名 | 博士(工学) | |||||
学位授与機関 | ||||||
学位授与機関名 | 奈良先端科学技術大学院大学 | |||||
学位授与年月日 | ||||||
学位授与年月日 | 2018-03-23 | |||||
学位授与番号 | ||||||
学位授与番号 | 甲第1555号 | |||||
電子化ID | ||||||
電子化ID |