WEKO3
アイテム
Efficient Noninvasive Fault Injection Method Utilizing Intentional Electromagnetic Interference
http://hdl.handle.net/10061/0002000531
http://hdl.handle.net/10061/00020005318fde84f9-48de-4a0b-833c-07e81e791fc0
| アイテムタイプ | 学術雑誌論文 / Journal Article(1) | |||||||||
|---|---|---|---|---|---|---|---|---|---|---|
| 公開日 | 2024-09-05 | |||||||||
| タイトル | ||||||||||
| タイトル | Efficient Noninvasive Fault Injection Method Utilizing Intentional Electromagnetic Interference | |||||||||
| 言語 | ||||||||||
| 言語 | eng | |||||||||
| キーワード | ||||||||||
| 主題Scheme | Other | |||||||||
| 主題 | Cryptographic devices | |||||||||
| キーワード | ||||||||||
| 主題Scheme | Other | |||||||||
| 主題 | electromagnetic information security | |||||||||
| キーワード | ||||||||||
| 主題Scheme | Other | |||||||||
| 主題 | fault injection method | |||||||||
| キーワード | ||||||||||
| 主題Scheme | Other | |||||||||
| 主題 | intentional electromagnetic interference (IEMI) | |||||||||
| 資源タイプ | ||||||||||
| 資源タイプ | journal article | |||||||||
| アクセス権 | ||||||||||
| アクセス権 | open access | |||||||||
| 著者 |
Nishiyama, Hikaru
× Nishiyama, Hikaru
× 藤本, 大介× Sone, Hideaki
× 林, 優一 |
|||||||||
| 抄録 | ||||||||||
| 内容記述タイプ | Abstract | |||||||||
| 内容記述 | In the fault injection method, an electromagnetic (EM) wave is injected to temporarily cause a fault at a specific time of the encryption process, the faulty outputs are obtained from the cryptographic device, and the secret key is extracted by analyzing the faulty outputs. In the conventional method, the intentional electromagnetic interference (IEMI) wave is injected at a random time because it is difficult to obtain information on the start time of the encryption process. Thus, a cryptographic module must execute a large number of encryption trials before the occurrence of a fault that enables the secret key to be extracted. In this article, we propose a fault injection method that can generate the faults at a specific time with high probability, which is like the method of injecting an IEMI wave synchronized with the start time of the encryption process. The proposed method inserts glitches into the encryption process at fixed times by injecting a continuous sinusoidal wave of a specific frequency while controlling the amplitude and phase. This generates faults required for the secret key analysis method with a high probability even when the start time of the encryption process cannot be obtained. We experimentally demonstrate the impact of the aforementioned IEMI using the advanced encryption standard, which is an ISO/IEC 18033 block cipher, implemented as a module on a standard evaluation board. The conventional method requires more than 30 000 encryption processes to obtain the secret key. In contrast, the results indicate that we can obtain the secret key with approximately 22 encryption processes which is almost three orders of magnitude less than that with the conventional method. This confirms that secret keys can be extracted in a brief period of time. Moreover, devices previously excluded from IEMI-based fault injection because they can only be accessed for a brief period because their physical access was surveilled, may now be the target of the threat. | |||||||||
| 書誌情報 |
en : IEEE Transactions on Electromagnetic Compatibility 巻 65, 号 4, p. 1211-1219, 発行日 2023-04-18 |
|||||||||
| 出版者 | ||||||||||
| 出版者 | IEEE | |||||||||
| ISSN | ||||||||||
| 収録物識別子タイプ | EISSN | |||||||||
| 収録物識別子 | 1558-187X | |||||||||
| 出版者版DOI | ||||||||||
| 関連タイプ | isReplacedBy | |||||||||
| 識別子タイプ | DOI | |||||||||
| 関連識別子 | https://doi.org/10.1109/TEMC.2023.3264586 | |||||||||
| 出版者版URI | ||||||||||
| 関連タイプ | isReplacedBy | |||||||||
| 識別子タイプ | URI | |||||||||
| 関連識別子 | https://ieeexplore.ieee.org/document/10104130 | |||||||||
| 権利 | ||||||||||
| 権利情報Resource | https://creativecommons.org/licenses/by/4.0/ | |||||||||
| 権利情報 | IEEE is not the copyright holder of this material. This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/ | |||||||||
| 著者版フラグ | ||||||||||
| 出版タイプ | NA | |||||||||
