| アイテムタイプ |
学術雑誌論文 / Journal Article(1) |
| 公開日 |
2024-05-16 |
| タイトル |
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タイトル |
An Algorithm to Correct the Sensitivity Distribution of a Retarding Field Analyzer for Photoelectron Holography |
| 言語 |
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言語 |
eng |
| キーワード |
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主題Scheme |
Other |
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主題 |
Photoelectron holography |
| キーワード |
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主題Scheme |
Other |
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主題 |
Electron energy analyzer |
| キーワード |
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主題Scheme |
Other |
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主題 |
Image processing |
| キーワード |
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主題Scheme |
Other |
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主題 |
Spherical harmonics |
| キーワード |
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主題Scheme |
Other |
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主題 |
Algorithm |
| 資源タイプ |
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資源タイプ |
journal article |
| アクセス権 |
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アクセス権 |
open access |
| 著者 |
松下, 智裕
橋本, 由介
Tomita, Hiroto
Sun, Zexu
Kawamura, Sota
Fujii, Mami N.
Mizuno,Jun
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| 抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
Recently, we developed a retarding field analyzer (RFA) with high energy resolution and wide acceptance angles, which was installed at BL25SU in SPring-8, Japan. This apparatus enables us to measure photoelectron angular distributions (photoelectron holograms) with a solid angle of ±49° in a few minutes, and this approach is now being applied to measure the atomic arrangements of dopants and interfaces. However, correcting the sensitivity distribution of the measured images by the RFA is important in processing this data. The sensitivity distribution of the RFA is difficult to measure directly because it depends on the geometry of a sample, the kinetic energy of the photoelectrons, and so forth. Therefore, we developed an image processing algorithm to estimate the sensitivity distribution using spherical harmonics. This approach is more accurate than a Fourier transform and can efficiently correct the sensitivity distribution. Moreover, the algorithm can also be adopted in a wide variety of other applications in addition to RFA measurements. |
| 書誌情報 |
en : e-Journal of Surface Science and Nanotechnology
巻 21,
号 3,
p. 183-187,
発行日 2023-03-25
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| 出版者 |
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出版者 |
The Japan Society of Vacuum and Surface Science |
| ISSN |
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収録物識別子タイプ |
EISSN |
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収録物識別子 |
1348-0391 |
| 出版者版DOI |
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関連タイプ |
isReplacedBy |
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識別子タイプ |
DOI |
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関連識別子 |
https://doi.org/10.1380/ejssnt.2023-027 |
| 出版者版URI |
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関連タイプ |
isReplacedBy |
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識別子タイプ |
URI |
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関連識別子 |
https://www.jstage.jst.go.jp/article/ejssnt/21/3/21_2023-027/_article |
| 権利 |
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権利情報Resource |
https://creativecommons.org/licenses/by/4.0/ |
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権利情報 |
$00A92023 The author(s) All articles published on e-J. Surf. Sci. Nanotechnol. are licensed under the Creative Commons Attribution 4.0 International (CC BY 4.0). You are free to copy and redistribute articles in any medium or format and also free to remix, transform, and build upon articles for any purpose (including a commercial use) as long as you give appropriate credit to the original source and provide a link to the Creative Commons (CC) license. If you modify the material, you must indicate changes in a proper way. |
| 著者版フラグ |
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出版タイプ |
NA |
